Table of Contents

Table of Contents

Preface

Applications of Fault Location Techniques for Transmission and Distribution Systems, pp. 1-39
(Tamer A. Kawady, Electrical Engineering Department, Minoufiya University, Shebin El-Kom, Egypt)

Current Transmission Fibers and R&Ds on Future Transmission Fibers, pp. 41-79
(Kazunori Mukasa, Katsunori Imamura, Takeshi Yagi, Fitel-Photonics Laboratory, Furukawa Electric Co. Ltd., Yawata-Kaigandori, Ichihara, Chiba, Japan)

Recent Developments in Transmission Pole Dynamic Analysis and Design, pp. 81-114
(Kaoshan Dai, Shen-En Chen, Department of Civil and Environmental Engineering, University of North Carolina at Charlotte, Charlotte, North Carolina)

Electric Transmission Line Approach to Non-Electric Transmission Lines, pp. 115-164
(R. Uklejewski, T. Czapski, Dept. of Electroengineering & Medical Bioengineering, Faculty of Mathematics, Physics and Technical Sciences, Kazimierz Wielki University in Bydgoszcz, Poland)

The Effects of Priority Service on Electricity Transmission: The Case of Interconnection Investment, pp. 165-184
(Isamu Matsukawa, Faculty of Economics, Musashi University, Tokyo, Japan)

Modelling of Strain Accumulation Process in Cyclically Loaded Transmission Belts, pp. 185-220
(Barbara Zupanèiè, Igor Emri, Centre for Experimental Mechanics, Faculty of Mechanical Engineering University of Ljubljana, Ljubljana, Slovenia)

Stepped Transmission Line and Impedance Matching, pp. 221-236
(Chunqi Qian, National Institute of Health, Bethesda, Maryland)

To the Theory of Magnetically Insulated Transmission Lines, pp. 237-257
(Svyatoslav Ya. Belomyttsev, Alexander V. Kirikov, Victor V. Ryzhov, Institute of High Current Electronics, Siberian Branch, Russian Academy of Sciences, Tomsk, Russia)

Periodic Regimes for Distortionless Lossy Transmission Lines Terminated by Parallel Connected RCL-Loads, pp. 259-293
(Vasil G. Angelov, University of Mining and Geology “St. I. Rilski”, Department of Mathematics, Sofia, Bulgaria)

Spatial Auction Markets with Unique Consumer Price, pp. 295-308
(E. Allevi, A. Gnudi, I.V. Konnov, M.T. Vespucci, Dept. Of Quantitative Methods, Brescia University, Brescia, Italy, and others)

Testing of CMOS Driven VLSI interconnects, pp. 309-336
(Devendra Kumar Sharma, B.K.Kaushik and R.K.Sharma, Department of Electronics and Communication Engineering, Meerut Institute of Engineering and Technology, Meerut, UP, India, and others)

Index