Recent Advances in Topography Research

Jan Buytaert, PhD (Editor)
Antwerpen-Berchem, Belgium

Series: Science in a Competitive and Globalizing World
BISAC: SCI030000

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Volume 10

Issue 1

Volume 2

Volume 3

Special issue: Resilience in breaking the cycle of children’s environmental health disparities
Edited by I Leslie Rubin, Robert J Geller, Abby Mutic, Benjamin A Gitterman, Nathan Mutic, Wayne Garfinkel, Claire D Coles, Kurt Martinuzzi, and Joav Merrick

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The book at hand covers many of the different classes of topography/profilometry, and will give the reader an overview of different aspects of current profilometric methods. The intent is to show the possibilities, the state-of-the-art and some recent advances in the field by bringing together a non-exhaustive but diverse selection of profilometric methods. Some methods are fresh and unique like the one pixel profilometer or the sampling moiré method. Others are more consolidated, like Fourier transform profilometry but now in real-time, and even commercially available, like the newest time-of-flight cameras for 3D vision.

The techniques in this book range from projection moiré to binary dithering pattern projection to areal surface mapping. They include an endoscopic implementation to an omnidirectional vision system and techniques using Fourier analysis to time-of-flight principles. Also, techniques applicable in biomedicine to engineering applications. Even from atomic force microscopy to optical coherence tomography, both used as topographical means. Finally, some in-depth specialist reviews are included of new profilometric methods or new commercial profilometric devices.

The book contains 12 chapters from selected authors from all over the world considered authorities in their field. The individual chapters are written to give a thorough introduction to each respective topographic method, and include a lot of background and abundant references, so that the book serves as a good introduction or reference. (Imprint: Nova)

Preface

Chapter 1 – Calibration and Adjustment of Areal Surface Topography Measuring Instruments
(Richard Leach and Claudiu Giusca, National Physical Laboratory, UK)

Chapter 2 – Superfast 3D Shape Measurement with Binary Dithering Techniques
(Yajun Wang, Beiwen Li and Song Zhang, Iowa State University, IA, USA)

Chapter 3 – High-Resolution Temporal Profilometry Using Fourier Estimation
(B. Ribbens, V.A. Jacobs, C. Vuye, J.A.N. Buytaert, J.J.J. Dircks and S. Vanlanduit, University of Antwerp, Belgium and others)

Chapter 4 – Single-Shot Phase Analysis by the Sampling Moiré Method and its Application to Displacement Measurement
(Shien Ri and Motoharu Fujigaki, National Institute of Advanced Industrial Science and Technology, Japan and others)

Chapter 5 – Validation of an Experimental Low-Cost Projection Moiré Profilometer for 3D Surface Imaging of Anatomical Models of the Middle Third of the Face
(Andreas Artopoulos, Trevor J. Coward, Joris J.J. Dirckx and J.A.N. Buytaert, King’s College London, UK)

Chapter 6 – High-Speed Fourier Transform Profilometry for Reconstructing Objects Having Arbitrary Surface Colours
(Liang-Chia Chen, National Taiwan University, Taiwan)

Chapter 7 – Large-Volume Optical Coherence Tomography with Real-Time Correction of Geometric Distortion Artifacts
(Sam Van der Jeught, J.A.N. Buytaert, Adrian Bradu, Adrian Gh. Podoleanu and Joris J.J. Dirckx, University of Antwerp, Belgium and others)

Chapter 8 – Morphological Characterization Of Biomaterials Using Atomic Force Microscopy
(Kyung Sook Kim and Hun-Kuk Park, Kyung Hee University, Korea)

Chapter 9 – A Device for Endoscopic Measurements of Forming Tools with Filigree Side Elements
(Christophe Ohrt, Steffen Matthias, Markus Kästner and Eduard Reithmeier, Leibniz Universität Hannover, Germany)

Chapter 10 – Omnidirectional Vision System with Conic Mirror for On-Line Quality Measurements on Quasi-Cylindrical Cavities
(L. Stroppa, A. Bastari, G. Angione and N. Paone, Università Politecnica delle Marche, Italy and others)

Chapter 11 – A Review on Commercial Solid State 3D Cameras for Machine Vision Applications
(S. Hussmann, M. Gonschior, B. Büttgen, C. Peter, S. Schwope, C. Perwass, M. Johannesson and E. Hällstig, West Coast University of Applied Sciences, Germany and others)
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Chapter 12 – Time of Flight Cameras (3D Vision)
(Luc Mertens, Rudi Penne and Bart Ribbens, University of Antwerp, Belgium and others)

Index

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