Interferometers: Fundamentals, Methods and Applications

Kystal Harmon (Editor)

Series: Physics Research and Technology
BISAC: SCI004000

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$230.00

Volume 10

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Special issue: Resilience in breaking the cycle of children’s environmental health disparities
Edited by I Leslie Rubin, Robert J Geller, Abby Mutic, Benjamin A Gitterman, Nathan Mutic, Wayne Garfinkel, Claire D Coles, Kurt Martinuzzi, and Joav Merrick

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This book presents readers’ with the latest research in interferometry. Chapters include research done on an approach that can be used to identify the performance of coherence scanning interferometers in the presence of vibration; the permeability engineering of semiconductor photonic devices; several interferometric structures based on bulk optics to achieving optical interleaving; interference lithography; recent results on laser surface patterning using interferometers and femtosecond laser radiation; the realization of the optical interferometers with the optical MEMS technology; a simple two-ray interferometer tuned by rotation; tuning of interference pattern period by rotation of an interferometer itself; the characteristics of a two-ray interferometer with fixed mirrors; the detection of acoustic fields from bounded ultrasonic beams by using laser interferometry techniques; and the use of lateral shearing interferometry as an important area of general interferometry.
(Imprint: Nova)

Preface
pp. vii-xi

Chapter 1
Vibration Sensitivity Assessment for Coherence Scanning Interferometry
(John R. Troutman, Chris J. Evans and Tony L. Schmitz, Center for Precision Metrology, University of North Carolina at Charlotte, Charlotte, NC, USA)
pp. 1-14

Chapter 2
Permeability Engineering of Semiconductor Photonic Devices
(Tomohiro Amemiya, Toru Kanazawa, Atsushi Ishikawa, Nobuhiko Nishiyama, Yasuyuki Miyamoto, Takuo Tanaka, and Shigehisa Arai, Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, Tokyo, Japan, and others)
pp. 15-36

Chapter 3
Interferometric Structures for Optical Interleaving
(Juan Zhang, School of Communication and Information Engineering, Shanghai University, Shanghai, China)
pp. 37-86

Chapter 4
Optical Interference Lithography
(Peng Xie, Rochester Institute of Technology, NY, USA)
pp. 87-124

Chapter 5
Laser Surface Patterning using a Modified Michelson Interferometer and Femtosecond Laser Radiation
(V. Oliveira and R. Vilar, Instituto Superior de Engenharia de Lisboa, Instituto Politécnico de Lisboa, Lisboa, Portugal, and others)
pp. 125-146

Chapter 6
Optical MEMS Interferometers
(Yasser M. Sabry, Diaa Khalil and Tarik Bourouina, Electronics and Communication Engineering Department, Faculty of Engineering, Ain-Shams University, Cairo, Egypt, and others)
pp. 147-172

Chapter 7
A Simple Two-Ray Interferometer Tuned by Rotation
(Sergey L. Mikerin, and Vladimir D. Ugozhaev, Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russian Federation)
pp. 173-182

Chapter 8
Tuning of Interference Pattern Period by Rotation of Interferometer Itself
(Sergey L. Mikerin and Vladimir D. Ugozhaev, Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russian Federation)
pp. 183-198

Chapter 9
A Rotational Tuning of Convergence Angle in a Two-Ray Interferometer with Fixed Mirrors
(Sergey L. Mikerin, and Vladimir D. Ugozhaev, Institute of Automation and Electrometry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russian Federation)
pp. 199-210

Chapter 10
Detection of Acoustic Fields from Bounded Ultrasonic Beams by Using Laser Interferometry Technique
(Yulia V. Korkh, Dmitry V. Perov, Anatoly B. Rinkevich, M.N. Miheev Institute of Metal Physics of Ural Branch of Russian Academy of Sciences, Sofia Kovalevskaya St., Ekaterinburg, Russia)
pp. 211-252

Chapter 11
Shearing Interferometers with a Singular Source of Light
(Khoroshun Anna, Ass. Professor, Physics and Electronics Department, East-Ukrainian National University named after Volodymyr Dahl, Pr. Radyansky, Severodonetsk, Ukraine)
pp. 253-268

Index
pp. 269-277

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